A. Fatih Sarioglu received the B.Sc. degree from Bilkent University, Ankara, Turkey in 2003, and the M.S. and Ph.D. degrees from Stanford University in 2005 and 2010, respectively, all in Electrical Engineering.
Dr. Sarioglu worked as a postdoctoral research associate at the Center for Nanoscale Science and Engineering at Stanford University from 2010 to 2012. From 2012-2014, he was a research fellow at the Center for Engineering in Medicine, Massachusetts General Hospital and Harvard Medical School. In October 2014, he joined the School of Electrical and Computer Engineering at the Georgia Institute of Technology as an assistant professor.
Dr. Sarioglu's research interests are at the interface of nano-/micro-engineering and biomedicine. He is particularly interested in developing N/MEMS-based technologies for biomedical applications.
- Nano- and Micro-systems for bio-molecular sensing and imaging
- Microfluidic devices for cell sorting and disease detection
- High-throughput bio-analytical instrumentation for cellular and molecular characterization
- Integrated platforms for point-of care diagnostics
- Implantable medical devices for minimally-invasive health monitoring
- Center for Integrated Systems Fellowship (Stanford University), 2005-2006
- Edward L. Ginzton Fellowship (Stanford University), 2003-2004
- Full scholarship for undergraduate studies (Bilkent University), 1999-2003
A. F. Sarioglu, M. Kupnik, S. Vaithilingam, and B. T. Khuri-Yakub, "Nanoscale topography of thermally-grown oxide films at right-angled convex corners of silicon," Journal of The Electrochemical Society 159, H79 (2012).
A. F. Sarioglu, S. Magonov, and O. Solgaard, "Tapping-mode force spectroscopy using cantilevers with interferometric high-bandwidth force sensors," Applied Physics Letters 100, 053109 (2012).
A. F. Sarioglu, M. Liu, and O. Solgaard, "High resolution nanomechanical mapping using interferometric-force-sensing AFM probes," IEEE Journal of Microelectromechanical Systems 20, 654 (2011).
A. F. Sarioglu, and O. Solgaard, "Modeling, design and analysis of interferometric cantilevers for time-resolved force measurements in tapping-mode atomic force microscopy," Journal of Applied Physics 109, 064316 (2011).
A. F. Sarioglu, and O. Solgaard, "Cantilevers with integrated sensor for time resolved force measurement in tapping-mode atomic force microscopy," Applied Physics Letters 93, 023114 (2008).
A. F. Sarioglu, A. Atalar, and F. L. Degertekin, "Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy," Applied Physics Letters 84, 5368 (2004).
Last revised November 17, 2016