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ECE Course Syllabus

ECE7141 Course Syllabus


Advanced Digital Systems Test (2-3-3)

Technical Interest
VLSI Systems and Digital Design

ECE 6140


Catalog Description
Design and test techniques for high-speed digital systems operating at rates above 100 MHz with a practical emphasis via substantial projects.

Bakoglu, Circuits, Interconnections and Packaging for VLSI, Addison Wesley, 1990. ISBN 9780201060089(optional) (comment: out of print)

Cheng, Field and Wave Electromagnetics, Addison Wesley, 1989. ISBN 9780201128192(optional)

Johnson & Graham, High Speed Digital Design, Prentice Hall, 1993. ISBN 9780133957242 (required)

Blood, MECL System Design Handbook, Motorola. ISBN HB205/D(optional)

Indicators (SPIs)
SPIs are a subset of the abilities a student will be able to demonstrate upon successfully completing the course.

Topical Outline
Introduction to High Speed Test  
ECL Technology  
Digital Testing Concepts  
Emitter Coupled Logic  
Electrical Interface to Automated Test Systems  
Resistive Divider Probe  
Testing High Speed CMOS, TTL, ECL Technologies 
Time-domain Analysis of Transmission Line Structures  
Printed Circuit Board (PCB) Design for High Speed Applications  
Crosstalk and Other Sources of Signal Distortions  
Power Distribution Techniques and Switching Noise  
Thermal Management  
Introduction to Gigahertz Digital Test  
Test Program Development  
Test Application and Debug