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ECE Course Syllabus
ECE7141 Course Syllabus
ECE7141
Advanced Digital Systems Test (2-3-3)
- Prerequisites
- ECE 6140
- Corequisites
- None
- Catalog Description
- Design and test techniques for high-speed digital systems operating at rates above 100 MHz with a practical emphasis via substantial projects.
- Textbook(s)
- Bakoglu, Circuits, Interconnections and Packaging for VLSI, Addison Wesley, 1990. ISBN 9780201060089(optional) (comment: out of print)
Cheng, Field and Wave Electromagnetics, Addison Wesley, 1989. ISBN 9780201128192(optional)
Johnson & Graham, High Speed Digital Design, Prentice Hall, 1993. ISBN 9780133957242 (required)
Blood, MECL System Design Handbook, Motorola. ISBN HB205/D(optional) - Topical Outline
Introduction to High Speed Test ECL Technology Digital Testing Concepts Emitter Coupled Logic Electrical Interface to Automated Test Systems Resistive Divider Probe Testing High Speed CMOS, TTL, ECL Technologies Time-domain Analysis of Transmission Line Structures Printed Circuit Board (PCB) Design for High Speed Applications Crosstalk and Other Sources of Signal Distortions Power Distribution Techniques and Switching Noise Thermal Management Introduction to Gigahertz Digital Test Test Program Development Test Application and Debug
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