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ECE Course Syllabus

ECE6140 Course Syllabus

ECE6140

Digital Systems Test (3-0-3)


Technical Interest
Group
VLSI Systems and Digital Design

Prerequisites
ECE 3060

Corequisites
None

Catalog Description
Introduction to the basic concepts in digital systems testing. Advanced topics in fault modeling and simulation, test pattern generation, and design for testability.

Textbook(s)
Abramovici, Breuer & Friedman, Digital Systems Testing and Testable Design, IEEE Press, 1995. ISBN 9780780310629 (required)


Strategic
Performance
Indicators (SPIs)
SPIs are a subset of the abilities a student will be able to demonstrate upon successfully completing the course.


Topical Outline
- Introduction, Issues and Basic Concepts  
- Fault Modeling  
- Fault Simulation  
- Testing Concepts  
- Automatic Test Pattern Generation  
- Test Compaction  
- Functional Testing  
- Design for Testability/Boundary Scan  
- Test Response Compression  
- Built-in Self-test  
- Memory and PLA testing  
- Fault Diagnosis  
- New directions