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ECE Course Syllabus
ECE6140 Course Syllabus
ECE6140
Digital Systems Test (3-0-3)
- Prerequisites
- ECE 3060
- Corequisites
- None
- Catalog Description
- Introduction to the basic concepts in digital systems testing. Advanced topics in fault modeling and simulation, test pattern generation, and design for testability.
- Textbook(s)
- Abramovici, Breuer & Friedman, Digital Systems Testing and Testable Design, IEEE Press, 1995. ISBN 9780780310629 (required)
- Topical Outline
- Introduction, Issues and Basic Concepts - Fault Modeling - Fault Simulation - Testing Concepts - Automatic Test Pattern Generation - Test Compaction - Functional Testing - Design for Testability/Boundary Scan - Test Response Compression - Built-in Self-test - Memory and PLA testing - Fault Diagnosis - New directions
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