Updates on the campus response to coronavirus (COVID-19)

ECE Course Syllabus

ECE6140 Course Syllabus


Digital Systems Test (3-0-3)

ECE 3060


Catalog Description
Introduction to the basic concepts in digital systems testing. Advanced topics in fault modeling and simulation, test pattern generation, and design for testability.

Abramovici, Breuer & Friedman, Digital Systems Testing and Testable Design, IEEE Press, 1995. ISBN 9780780310629 (required)

Topical Outline
- Introduction, Issues and Basic Concepts  
- Fault Modeling  
- Fault Simulation  
- Testing Concepts  
- Automatic Test Pattern Generation  
- Test Compaction  
- Functional Testing  
- Design for Testability/Boundary Scan  
- Test Response Compression  
- Built-in Self-test  
- Memory and PLA testing  
- Fault Diagnosis  
- New directions