Photo file: 
photo of Tom Michaels
Full name: 
Thomas E Michaels
Job title: 
Prof of the Practice Emeritus
Technical Interest Groups: Electromagnetics
Email address: 
VL C296B

Dr. Michaels grew up in the Pacific Northwest and studied at Washington State University where he earned a B.S. in Physical Metallurgy in 1965 and a Ph.D. in Physics in 1972. He came to Georgia Tech from industry in 2002 with over 30 years of experience in the development and successful deployment of complex automated measurement systems incorporating materials characterization, ultrasonic nondestructive evaluation, instrumentation development, and machine design and control. He retired from Georgia Tech in 2017 and holds the title of Professor of the Practice Emeritus


At Panametrics, Inc., he led the Automated Systems Department to international recognition as a quality supplier of ultrasonic inspection systems, which are used by universities, research laboratories, material suppliers, and component manufacturers for automated ultrasonic inspection of materials and structures. In other positions in industry, including two start-up companies of which he was a principal, he led the development of measurement systems for manufacturing process control and in-service inspection of critical power generation equipment. He holds a joint appointment in Mechanical Engineering.

Research interests: 
  • Nondestructive evaluation of components and structures
  • Materials characterization using ultrasonic methods
  • Development of instrumentation and controls for automated testing
  • Digital signal processing of ultrasonic signals
  • Measurement technology and sensor development
  • Member, American Society for Nondestructive Testing
  • Member, American Society for Metals
  • Seven Patents Related to Ultrasonic Inspection Methods and Systems
  • One Patent Pending for a Graphite Electrode Inspection System

D. J. Cotter, T. E. Michaels, J. E. Michaels, D. Kass, M. E. Stanton, I. V. Kosenko and F. H. C. Hotchkiss, "Squirter, Roller Probe, and Air-Coupled Transducer Techniques for Low Frequency Inspection of Advanced Composite Materials", Proceedings of the 15th World Conference on Non-Destructive Testing, Rome, Italy, October 15-21, 2000.

T. E. Michaels and B. D. Davidson, "Ultrasonic Inspection Detects Hidden Damage in Composites",Advanced Materials and Processes, Vol. 143. No. 3, pp. 34-38, 1993.

J. E. Michaels, T. E. Michaels and W. Sachse, "Applications of Deconvolution to Acoustic Emission Signal Analysis", Materials Evaluation, Vol. 39, No. 11, pp. 1032-1036, 1981.

S. J. Mech and T. E. Michaels, "Development of Ultrasonic Examination Methods for Stainless Steel Weld Inspection", Materials Evaluation, Vol. 35, No. 7, pp. 81-86, 1977.

J. N. Johnson, O. E. Jones and T. E. Michaels, "Elastic Precursor Decay in Single Crystal Materials", Journal of Applied Physics , Vol. 41, p. 2330, 1969.

Last revised February 16, 2018

Map of Georgia Tech

Georgia Institute of Technology
North Avenue, Atlanta, GA 30332
Phone: 404-894-2000