Georgia Tech Characterization Short Course Series: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS

Event Details

Friday, December 14, 2018

8:30pm - 4:00pm

Location: 
Marcus Nanotechnology Building | 345 Ferst Dr NW | Atlanta, GA | 30332

For More Information

Contact:

Questions? Contact:

Dr. Walter Henderson
Georgia Tech Institute for Electronics and Nanotechnology
404.894.4702

Event Details

Description:The Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on “Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS” on December  13 & 14, 2018.
 
This 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in XPS and/or SIMS. It will cover essential surface science analytical techniques, including point spectra, area maps, and depth profiles as well as sample preparation techniques.
 
Attendees will learn how to choose and prepare suitable samples, set up and execute an experiment, and analyze data. This course is suitable for both new and experienced researchers.
 
Target Audience:
Attendance is open to researchers from academia, industry and government laboratories/ organizations as well as to current Georgia Tech students, IEN and MCF users. Anyone who is interested in characterization of materials is invited and strongly encouraged to participate. The concepts and techniques presented are broadly applicable to materials.

Rates: *Rates include lunches on all days*

Georgia Tech Rate: $150
Academic and Government Rate: $250
Industry Rate: $500

Agenda

Day1 – Photoelectron Spectroscopy:

08:30 – Registration starts

09:00:  Introduction and Scope of Short Course – Prof. F. Alamgir

Morning session including the following activities:

  • Lecture onTheoretical background of Photoelectron Spectroscopy
  • Tour of MCF characterization labs
  • Coffee break

12:00 – 13:00:  Lunch break

Afternoon session include the following activities: 

  • Introduction to XPS analysis software
  • XPS hands-on operation and data analysis sessions.

15:10 – 16:00:  General comments:  Open question and answer session

Day2 – Time of Flight SIMS:

09:00 – Breakfast starts

09:30:  Introduction– Prof. F. Alamgir

Morning session including the following activities:

  • Tour of IEN microfabrication facility
  • Coffee break
  • Practical concerns for ToF-SIMS and Alternate Surface Science Techniques

11:30 – 13:00:  Lunch break

Afternoon session including the following activities: 

  • Remote Demonstration of ToF-SIMS operation
  • ToF-SIMS Data analysis and/or hands-on session.
  • Open question and answer session

16:00: Closing comments

REGISTER FOR THE COURSE AT THIS LINK

Last revised December 3, 2018