Ph.D. Proposal Oral Exam - Brian Wier

Event Details

Tuesday, December 12, 2017

10:00am - 12:00pm

Room 530, TSRB

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Event Details

Title:  Modeling and Design of Silicon-Germanium Heterojunction Bipolar Transistors for Reliability-aware Circuit Design


Dr. Cressler, Advisor    

Dr. Shen, Chair

Dr. Yoder


The objective of the proposed research is to analyze the mechanisms of breakdown and aging in SiGe HBTs such that the deliverable, reliable performance of high-frequency SiGe HBT circuits and systems can be maximized. The anticipated results of this study will be the enablement of reliable higher power operation in SiGe HBT technologies through the design of novel superjunction collector devices, an enhanced understanding of device degradation under transient and RF stress conditions, and the development of device aging compact models to be incorporated in a circuit design environment.

Last revised December 4, 2017