ECE Research

Faculty

Dr. Thomas Gaylord
Dr. Elias Glytsis
Dr. Don Davis

Graduate Students

Jon Maikisch

Jonathan received the B.E. and M.E. degree in electrical engineering from Stevens Institute of Technology in Hoboken, New Jersey. He is currently a Ph.D. student in the Optics Laboratory at the Georgia Institute of Technology.

His current research interests are in integrated diffractive optics, optical interconnects, and integrated optical chemical and biological sensors.

Jonathan is a member of the Optical Society of America (OSA), the Institute of Electrical and Electronics Engineers (IEEE), Eta Kappa Nu, and Tau Beta Pi.

Matt Burrow

Matt received his B.S. in electrical engineering from the United States Military Academy in 1992. He later received his M.S in electrical engineering from the Georgia Institute of Technology in 2002 followed by service as an Instructor and Assistant Professor at West Point through 2005. He is currently a graduate student pursuing his Ph.D. at the Georgia Institute of Technology under the advisement of Dr. Thomas K. Gaylord.

His current research interests include photonics engineering, remote sensing and satellite communications and navigation.

Matt is an active duty Lieutenant Colonel in the United States Army with 17 years of service.

Matthieu Leibovici

Matthieu received his M.S. in electrical and computer engineering from Supelec (French Graduate School of Engineering) in 2011. The same year, he received his M.S. in electrical engineering from the Georgia Institute of Technology. He is currently a Ph.D. student at the Georgia Institute of Technology under the advisement of Dr. Thomas K. Gaylord.

His current research interests include photonics engineering and multi-beam interference lithography.

Micah Jenkins

Micah received his B.S. in electrical engineering from Brigham Young University in 2011. He is currently a Ph.D. student at the Georgia Institute of Technology under the advisement of Dr. Thomas K. Gaylord.

His current research interests include optical fiber and fiber-based device characterization, integrated optics, and optofluidics.