Testing and Reliability Engineering Lab

"Mixed Signal/Analog/RF Test, Reliability, Yield and Low Power for Next Generation Systems"

School of Electrical and Computer Engineering
Georgia Institute of Technology

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Doctoral Students

Natarajan, Vishwanath
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 Kook, Se Hun
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Choi, Hyun
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 Natarjan, Jayaram
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Nisar, M. Mudassar
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 Sen, Shreyas
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Devarakond, Shyam Kumar
Email Phone: 703-380-5274
Shyam Kumar Devarakond received his Bachelors Degree in (2007) in Electrical and Electronics Engineering from Anna University, Tamil Nadu, India. He is currently a Graduate Research Assistant in the School of Electrical and Computer Engineering at Georgia Institute of Technology where he is working towards his PhD degree under Dr. Abhijit Chatterjee.
His Research interests are low cost RF system testing, dynamic low power adaptation of Wireless systems, BIST assisted tuning for wideband RF modules. He is currently working on extraction of digital signatures for sensing parametric variations in RF systems, DSP assisted process sensing and self healing RF systems.
 Kumar, Gokul
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Lee, Deuk
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Alumni

Senguttuvan, Rajarajan
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Texas Instruments, Dallas
 Ashouei, Maryam
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Han, Donghoon
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Texas Instruments, Dallas
 Akbay, S. Sermet
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Srinivasan, Ganesh
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Texas Instruments, Dallas
Job Description: Product & Test Technology Development for TI's Next Generation Wireless RF Chipsets
Research Interests: Wireless System Test, low-cost mixed-signal/RF Test, DfT, high-volume manufacturing tests, low-cost ATE architecture
 Goyal, Shalabh
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National Semiconductor, Santa Clara
Job Description: Senior Test Engineer, Data Converter Division
Research Interest: Mixed Signal Testing, RF Testing
Bhattacharya, Soumendu
Texas Instruments, Dallas

 Halder, Achintya


Diril, A. Utku


Dhillon, Yuvraj Singh


Seo, Chung-Seok (Andy)


Xuan, Xiangdong


Choi, Kyu-won


Gomes, Alfred V.
National Semiconductor, Santa Clara
Voorakaranam, Ramakrishna


Chakrabarti, Sudip


Cherubal, Sasikumar


Hou, Junwei


Pant, Pankaj


Kim, Bruce C.


Yoon, Heebyung


Variyam, Pramodchandran N.