ECE6140 -  Digital Systems Test  (3-0-3)

Prerequisites:  ECE 3060

Corequisites:  None

Catalog Description:  Introduction to the basic concepts in digital systems testing. Advanced topics in fault modeling and simulation, test pattern generation, and design for testability.

Textbook(s):  Abramovici, Breuer & Friedman, Digital Systems Testing and Testable Design, IEEE Press, 1995. (required)

Topical Outline:  - Introduction, Issues and Basic Concepts - Fault Modeling - Fault Simulation - Testing Concepts - Automatic Test Pattern Generation - Test Compaction - Functional Testing - Design for Testability/Boundary Scan - Test Response Compression - Built-in Self-test - Memory and PLA testing - Fault Diagnosis - New directions